Fluke MET/CAL Procedure ============================================================================= INSTRUMENT: Philips PM 2534: (1 year) CAL VER IEEE /5500 INSTRUMENT: Philips PM 2535: (1 year) CAL VER IEEE /5500 DATE: 23-Sep-98 AUTHOR: Fluke REVISION: $Revision: 1.1 $ ADJUSTMENT THRESHOLD: 90% NUMBER OF TESTS: 47 NUMBER OF LINES: 302 CONFIGURATION: Fluke 5500A ============================================================================= # # Source: # # Compatibility: # MET/CAL 4.0 or later # # Subprocedures: # None # # Required Files: # 55_253vr.bmp # 55_253cu.bmp # 55_2534w.bmp # # System Specifications: # TUR calculation is based on specification interval of the accuracy file. # The default 5500A accuracy file contains 90 day specs. # # Fluke makes no warranty, expressed or implied, as to the fitness # or suitability of this procedure in the customer's application. # # The 90 day specifications of the 5500A are used in TUR computations. # STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON 1.001 ASK- R Q N P F W 1.002 HEAD PRELIMINARY INSTRUCTIONS 1.003 DISP All UUTs require a minimum warm-up period of 30 minutes. 1.003 DISP Connect the UUT to IEEE-488 port 1. 1.004 IEEE INIT[10] 1.005 PIC 55_253vr 1.006 HEAD {VOLTAGE TEST} 1.007 5500 0V S 2W 1.008 IEEE FNC VDC[D500]NUL N[D4000]NUL OFF[10] 1.009 IEEE RNG 3E-03,NUL ON,TRIG B[10] 1.010 5500 300.0000mV S 2W 1.011 IEEE [T0]X[I]X[I]X[I] 1.012 MEME 1.013 MATH MEM = MEM / 1e-3 1.014 MEME 1.015 MEMC mV 0.0324U 2.001 5500 -300.0000mV S 2W 2.002 IEEE [T0]X[I]X[I]X[I] 2.003 MATH MEM = MEM / 1e-3 2.004 MEME 2.005 MEMC mV 0.0324U 3.001 IEEE NUL OFF,RNG 3E+00[10] 3.002 5500 3.0000V S 2W 3.003 IEEE [T0]X[I]X[I]X[I] 3.004 MEME 3.005 MEMC V 0.000202U 4.001 5500 -3.0000V S 2W 4.002 IEEE [T0]X[I]X[I]X[I] 4.003 MEME 4.004 MEMC V 0.000202U 5.001 IEEE RNG 30E+00[10] 5.002 5500 10.0000V S 2W 5.003 IEEE [T0]X[I]X[I]X[I] 5.004 MEME 5.005 MEMC V 0.00261U 6.001 5500 15.0000V S 2W 6.002 IEEE [T0]X[I]X[I]X[I] 6.003 MEME 6.004 MEMC V 0.00261U 7.001 5500 30.0000V S 2W 7.002 IEEE [T0]X[I]X[I]X[I] 7.003 MEME 7.004 MEMC V 0.00261U 8.001 5500 -30.0000V S 2W 8.002 IEEE [T0]X[I]X[I]X[I] 8.003 MEME 8.004 MEMC V 0.00261U 9.001 IEEE RNG 300E+00[10] 9.002 5500 300.0000V S 2W 9.003 IEEE [T0]X[I]X[I]X[I] 9.004 MEME 9.005 MEMC V 0.0243U 10.001 5500 -300.0000V S 2W 10.002 IEEE [T0]X[I]X[I]X[I] 10.003 MEME 10.004 MEMC V 0.0243U 11.001 5500 * S 11.002 HEAD {AC VOLTAGE} 11.003 IEEE VAC 300E-03,FIL OFF[10] 11.004 5500 300.000mV 400H SI S 2W 11.005 IEEE [T0]X[I]X[I]X[I] 11.006 MEME 11.007 MATH MEM = MEM / 1e-3 11.008 MEMC mV 1.19U 400H 12.001 IEEE VAC 300E-03,FIL ON[10] 12.002 5500 300.000mV 20kH SI S 2W 12.003 IEEE [T0]X[I]X[I]X[I] 12.004 MEME 12.005 MATH MEM = MEM / 1e-3 12.006 MEMC mV 3.6U 20KH 13.001 5500 200.000mV 40H SI S 2W 13.002 IEEE [T0]X[I]X[I]X[I] 13.003 MEME 13.004 MATH MEM = MEM / 1e-3 13.005 MEMC mV 1.19U 40H 14.001 5500 200.000mV 1kH SI S 2W 14.002 IEEE [T0]X[I]X[I]X[I] 14.003 MEME 14.004 MATH MEM = MEM / 1e-3 14.005 MEMC mV 3.6U 1KH 15.001 5500 200.000mV 50kH SI S 2W 15.002 IEEE [T0]X[I]X[I]X[I] 15.003 MEME 15.004 MATH MEM = MEM / 1e-3 15.005 MEMC mV 9.44U 50KH 16.001 IEEE RNG 3E+00,FIL ON[10] 16.002 5500 3.00090V 40H SI S 2W 16.003 IEEE [T0]X[I]X[I]X[I] 16.004 MEME 16.005 MEMC V 0.012U 40H 17.001 5500 3.00000V 400H SI S 2W 17.002 IEEE [T0]X[I]X[I]X[I] 17.003 MEME 17.004 MEMC V 0.012U 400H 18.001 5500 3.00000V 400H SI S 2W 18.002 IEEE [T0]FIL OFF,X[I]X[I]X[I] 18.003 MEME 18.004 MEMC V 0.012U 400H 19.001 5500 3.00000V 5kH SI S 2W 19.002 IEEE [T0]FIL ON,X[I]X[I]X[I] 19.003 MEME 19.004 MEMC V 0.012U 5KH 20.001 5500 3.00000V 20kH SI S 2W 20.002 IEEE [T0]X[I]X[I]X[I] 20.003 MEME 20.004 MEMC V 0.036U 20KH 21.001 5500 3.00000V 50kH SI S 2W 21.002 IEEE [T0]X[I]X[I]X[I] 21.003 MEME 21.004 MEMC V 0.0945U 50KH 22.001 IEEE RNG 30E+00,FIL ON[10] 22.002 5500 12.0000V 1kH SI S 2W 22.003 IEEE [T0]X[I]X[I]X[I] 22.004 MEME 22.005 MEMC V 0.054U 1KH 23.001 5500 20.0000V 20kH SI S 2W 23.002 IEEE [T0]X[I]X[I]X[I] 23.003 MEME 23.004 MEMC V 0.28U 20KH 24.001 5500 30.0000V 50kH SI S 2W 24.002 IEEE [T0]X[I]X[I]X[I] 24.003 MEME 24.004 MEMC V 0.9U 50KH 25.001 IEEE RNG 300E+00,FIL ON[10] 25.002 5500 300.000V 50H SI S 2W 25.003 IEEE [T0]X[I]X[I]X[I] 25.004 MEME 25.005 MEMC V 1.1U 50H 26.001 5500 100.000V 1kH SI S 2W 26.002 IEEE [T0]X[I]X[I]X[I] 26.003 MEME 26.004 MEMC V 1.1U 1KH 27.001 5500 200.000V 1kH SI S 2W 27.002 IEEE [T0]X[I]X[I]X[I] 27.003 MEME 27.004 MEMC V 1.1U 1KH 28.001 5500 300.000V 1kH SI S 2W 28.002 IEEE [T0]X[I]X[I]X[I] 28.003 MEME 28.004 MEMC V 1.1U 1KH 29.001 5500 * S 29.002 HEAD {2-WIRE RESISTANCE} 29.003 5500 0Z S 2W 29.004 IEEE FNC RTW,RNG 3E+3,ZER ON[D4000]ZER M[D4000][10] 29.005 IEEE RTW 3E+03,ZER ON[10] 29.006 5500 100.0000Z S 4W 29.007 IEEE [T0]X[I]X[I]X[I] 29.008 MEME 29.009 MEMC Z 0.5U 30.001 IEEE RNG 3E+03[10] 30.002 5500 1.0000kZ S 4W 30.003 IEEE [T0]X[I]X[I]X[I] 30.004 MEME 30.005 MATH MEM = MEM / 1e+3 30.006 MEMC kZ 0.0003U 31.001 IEEE RNG 30E+03[10] 31.002 5500 10.0000kZ S 4W 31.003 IEEE [T0]X[I]X[I]X[I] 31.004 MEME 31.005 MATH MEM = MEM / 1e+3 31.006 MEMC kZ 0.003U 32.001 IEEE RNG 300E+03[10] 32.002 5500 100.0000kZ S 2W 32.003 IEEE [T0]X[I]X[I]X[I] 32.004 MEME 32.005 MATH MEM = MEM / 1e+3 32.006 MEMC kZ 0.03U 33.001 IEEE RNG 3E+06[10] 33.002 5500 1.0000MZ S 2W 33.003 IEEE [T0]X[I]X[I]X[I] 33.004 MEME 33.005 MATH MEM = MEM / 1e+6 33.006 MEMC MZ 0.0005U 34.001 IEEE RNG 30E+06[10] 34.002 5500 10.0000MZ S 2W 34.003 IEEE [T0]X[I]X[I]X[I] 34.004 MEME 34.005 MATH MEM = MEM / 1e+6 34.006 MEMC MZ 0.011U 35.001 5500 * S 35.002 HEAD {DC - CURRENT TEST} 35.003 PIC 55_253cu 35.004 IEEE [T0]IDC 30E-03,ZER ON[10][D3500]ZER M[10] 35.005 MEME 35.006 5500 30.0000mA S 2W 35.007 IEEE [T0]X[I]X[I] 35.008 MEME 35.009 MATH MEM = MEM / 1e-3 35.010 MEMC mA 0.023U 36.001 5500 -30.0000mA S 2W 36.002 IEEE [T0]X[I]X[I]X[I] 36.003 MEME 36.004 MATH MEM = MEM / 1e-3 36.005 MEMC mA 0.023U 37.001 IEEE RNG 3E+00[10] 37.002 5500 1.9000A S 2W 37.003 IEEE [T0]X[I]X[I]X[I] 37.004 MEME 37.005 MEMC A 0.00367U 38.001 5500 * S 38.002 HEAD {AC CURRENT VERIFICATION} 38.003 IEEE IAC 30E-03,FIL ON[10] 38.004 5500 30.0000mA 50H SI S 2W 38.005 IEEE [T0]X[I]X[I]X[I] 38.006 MEME 38.007 MATH MEM = MEM / 1e-3 38.008 MEMC mA 0.13U 50H 39.001 5500 30.0000mA 1kH SI S 2W 39.002 IEEE [T0]X[I]X[I] 39.003 MEME 39.004 MATH MEM = MEM / 1e-3 39.005 MEMC mA 0.13U 1KH 40.001 IEEE RNG 3E+00[10] 40.002 5500 1.9000A 50H SI S 2W 40.003 IEEE [T0]X[I]X[I]X[I] 40.004 MEME 40.005 MEMC A 50H 0.0083U 41.001 5500 * S 41.002 HEAD {4-WIRE RESISTANCE} 41.003 PIC 55_2534w 41.004 IEEE RFW 3E+3 41.005 5500 100.0000Z S 2W 41.006 IEEE [T0]X[I]X[I]X[I] 41.007 MEME 41.008 MEMC Z 0.5U 42.001 IEEE RNG 3E+03[10] 42.002 5500 1.0000kZ S 2W 42.003 IEEE [T0]X[I]X[I]X[I] 42.004 MEME 42.005 MATH MEM = MEM / 1e+3 42.006 MEMC kZ 0.0003U 43.001 IEEE RNG 30E+03[10] 43.002 5500 10.0000kZ S 2W 43.003 IEEE [T0]X[I]X[I]X[I] 43.004 MEME 43.005 MATH MEM = MEM / 1e+3 43.006 MEMC kZ 0.003U 44.001 IEEE RNG 300E+03[10] 44.002 5500 100.0000kZ S 2W 44.003 IEEE [T0]X[I]X[I]X[I] 44.004 MEME 44.005 MATH MEM = MEM / 1e+3 44.006 MEMC kZ 0.03U 45.001 IEEE RNG 3E+06[10] 45.002 5500 1.0000MZ S 2W 45.003 IEEE [T0]X[I]X[I]X[I] 45.004 MEME 45.005 MATH MEM = MEM / 1e+6 45.006 MEMC MZ 0.0005U 46.001 5500 * S 46.002 HEAD {TEMPERATURE TEST - 4 WIRES} 46.003 IEEE [T0]TDC[10] 46.004 MEME 46.005 5500 100Z S 2W 46.006 ACC 0.0000degC TOL 46.007 IEEE [T0]X[I]X[I]X[I] 46.008 MEME 46.009 MEMC 0.0000degC 1U 47.001 IEEE [GTL] 47.002 END